Circuit Retrieval and Optimization with Parameter Guidance using LLMs” was published by researchers at Duke University and Synopsys. Abstract “Modern very large-scale integration (VLSI) design ...

LC- lumped circuit model dependent on surface current flow along the strips of via based electromagnetic band gap (EBG) structures has been investigated in this paper. The propagating surface waves ...

Hot carrier injection (HCI) effect is one of the major reliability concerns in VLSI circuits. This paper presents a scalable reliability simulation flow, including a logic cell characterization method ...