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Semiconductor Engineering3d
Domain Adaptation for Image Classification of Defects in Semiconductor Manufacturing (Infineon, U. Padova et al.)
A new technical paper titled “Domain Adaptation for Image Classification of Defects in Semiconductor Manufacturing” was ...
Frontiers21d
Efficient tree species classification using machine and deep learning algorithms based on UAV-LiDAR data in North China - Frontiers
The main objectives of this paper are as follows: (1) to evaluate the accuracy of machine learning and deep learning algorithms in classifying tree species using UAV-LiDAR data; (2) to investigate the ...
IEEE26d
A Joint Learning of Force Feedback of Robotic Manipulation and Textual Cues for Granular Materials Classification | IEEE Journals & Magazine | IEEE Xplore
This method achieves an 84.10% classification accuracy, surpassing traditional supervised learning by 10% and outperforming supervised contrastive learning by more than 40%, demonstrating the positive ...
IEEE29d
Sample-Level Improved Cross-Source Contrastive Learning for PAN and MS Joint Classification - IEEE Xplore
In recent years, the number and ways of acquiring panchromatic (PAN) images and multispectral (MS) images have increased, and manual labeling costs have also increased. Processing these data ...