News
An overview on the electrostatic discharge (ESD) protection circuits by using the silicon controlled rectifier (SCR)-based devices in CMOS ICs is presented. The history and evolution of SCR device ...
GaAs Schottky diodes varying in size from 40 mum to 400 mum anode periphery have been tested to assess their effectiveness as ESD protection devices in FET-based MMICs. ESD failure voltage is seen to ...
Some results have been hidden because they may be inaccessible to you
Show inaccessible results