Microelectronics Journal (2023). [3] Machine learning classification algorithm for VLSI test cost reduction. Integration (2022).

An adaptive testing procedure that uses spatial defect clustering information and the available test results for neighboring dies to optimize test costs for VLSI testing is proposed. For the same ...

In the VLSI Physical Design Stage, Floorplanning is an essential step, as it is an effective means to manage circuit design complexity, which is increasing with the advancement in technology.