In this part I’ll introduce the conceptual framework of design patterns and walk through a demonstration of evaluating a design pattern for a particular use case.

System-level test (SLT) has evolved into a necessary test insertion for high-performance processors and chiplets.

By Gidget Cathcart, Agilent Technologies Testing digital designs usually requires one or more digital signals, some of which can be very difficult to generate. Pattern generators ...

Logic BIST (LBIST) is a well-stablished traditional solution for meeting automotive testing standards. However, using pseudo-random LBIST patterns can be challenging when trying to achieve ...

Deterministic test patterns applied in-system provide the highest level of test quality within a pre-defined test window, as well as the ability to change test content as devices mature or age through ...