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How do you calculate capability indices? Capability analysis is an essential tool for statistical process control (SPC) and ...
Employing more stress testing at the wafer level improves quality while reducing burn-in time and cost. So why isn’t it ...
Intel shifts focus to cost-cutting with 14A node, abandoning 18A amid weak demand. Discover how this strategy boosts margins ...
This important study presents a new method for longitudinally tracking cells in two-photon imaging data that addresses the specific challenges of imaging neurons in the developing cortex. It provides ...
Statistical Process Control (SPC) and Automatic Process Control (APC) are two different methods for quality improvement and process adjustment that have been developed in isolation from each other and ...
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Due to changes in production conditions and strategies, industrial processes have various operation modes. However, the model based on a single operation mode cannot adapt to multimode process, ...
28:04 – Discussion on statistical process control and how to identify trends in data over time 30:23 – Lawrence emphasizes the importance of using data to take action, not just to collect it ...
This capability allows the Configuration Management process to identify new and changing assets across the infrastructure and maintains the existing inventory of Configuration Items.