Last month, David M. Nicol received a “Test of Time” award at the 39th ACM SIGSIM Conference on Principles of Advanced Discrete Simulation (PADS) for a 2005 paper he co-wrote with some then postdocs ...

Innovation requires information, context, collaboration, experimentation, and even failure. Using simulation to make ...

Knowledge Center Design for Test (DFT) Techniques that reduce the difficulty and cost associated with testing an integrated circuit.

Abstract: Silicon carbide devices have several advantages, including high blocking voltage, lower conduction losses, and lower switching losses, when compared to silicon-based devices. This paper ...

A molded case circuit breaker (MCCB) is a critical low-voltage switching device widely used to protect electrical circuits from fault currents by interrupting the flow of excessive current. During the ...