News

IEEE17d
An ultra-dense irradiation test structure with a NAND/NOR readout chain for characterizing soft error rates of 14nm combinational logic circuits
Abstract: This paper describes a 14nm test chip employing a novel NAND/NOR readout chain for characterizing soft error rate (SER) in combinational logic gates. The ...
IEEE22d
Memory and Logic soft error improvement using phase transition material assisted transistors
Abstract: Phase transition Material (PTM) assisted logic and SRAM bitcells have been proposed with improved soft error tolerance. The large insulating resistance of ...
GitHub26d
Example showing use of SWIG to generate wrappers for Java, Python and C#.
It also generates the language wrappers for Java and Python, and builds the native interface DLLs too (in Java and Python solution configurations respectively). The Java JAR is built separately with ...