In particular, when the Pareto front of problems is incomplete, these algorithms cannot obtain a set of uniformly distribution solutions by using the conventional weight design methods. In the ...

“We identified, categorized, and discussed automatic defect inspection algorithms that analyze scanning electron microscopy (SEM) images for semiconductor manufacturing (SM). This is a topic of ...

Abstract: The wafer-on-wafer (WoW) stacked structure exhibits pioneering advantages in near-memory computing but encounters challenges in 3D analysis due to the miniaturization of vertical connection ...