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Pseudo-random testing patterns are inadequate for meeting the stringent requirements of automotive electronics.
Identify early indicators of risk by analyzing timing margin data from within the chip.
SOLVING DIGITAL TEST ... system. For this application, multiple digital stimuli of varying widths may be required, with enough memory to produce the necessary bit stream patterns. In this case ...
Plano, Texas, USA – November 5 2024 -- Siemens Digital Industries Software today introduced Tessent™ In-System Test software, a groundbreaking design-for-test (DFT ... to apply embedded deterministic ...
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