Beginning with system-level debug and production test, boundary scan provides many other system benefits when it is extended to field support. For example, boundary scan can be used for quick and easy ...

However, SLT provides test in actual application-level ... (T2000 System Software) application software that has been used conventionally in the T2000. Fig. 2: The Hybrid SLT solution combines a T2000 ...

The OSD335x is an example ... test as the volume of the devices drops and the process becomes more manual. For example, the component tests for a generic CPU are much more automated than system ...

Due to new semiconductor devices’ increasing design complexity and extreme process technology, increased test coverage is needed to meet stricter quality requirements. To solve this problem, ...

Designed to perform system-level testing of NVMe BGA ... executive vice president of the Memory Test Business Unit. “This effort is just the latest example of our commitment to expand and ...

ISE Labs will implement the new EXA Scale system, configured with Advantest’s newest Pin Scale 5000 digital card ... test, wafer probe, wafer bump, substrate design and supply, wafer level ...

The company offers a wide range of V93000 options together with complementary test instruments – including universal analog and digital test cards ... and offers system-level test solutions ...