Beginning with system-level debug and production test, boundary scan provides many other system benefits when it is extended to field support. For example, boundary scan can be used for quick and easy ...

The OSD335x is an example ... test as the volume of the devices drops and the process becomes more manual. For example, the component tests for a generic CPU are much more automated than system ...

Designed to perform system-level testing of NVMe BGA ... executive vice president of the Memory Test Business Unit. “This effort is just the latest example of our commitment to expand and ...

Due to new semiconductor devices’ increasing design complexity and extreme process technology, increased test coverage is needed to meet stricter quality requirements. To solve this problem, ...

The system level test board used is similar to the reference design or evaluation board provided to the customer. Determining if the operation was successful: measured according to the test results or ...

The company offers a wide range of V93000 options together with complementary test instruments – including universal analog and digital test cards ... and offers system-level test solutions ...

Board- and system-level test was the focus of ... environment is hard to map onto ATE. For example, the chipmaker developing the manufacturing test usually won’t even know what additional ...