Six Sigma is a data-driven approach to quality, aimed at reducing variation and the associated defects, wastes, and risks in ...

Detecting macro-defects early in the wafer processing flow is vital for yield and process improvement, and it is driving innovations in both inspection techniques and wafer test map analysis. At the ...

Lean and Six Sigma are the perfect pair for improving customer value by reducing waste, boosting productivity, and reducing defects and variations in products and services. Lean Six Sigma combines ...

Process marginality and parametric outliers are now persistent problems at most technology nodes. Engineers are finding a combination of inspection techniques, along with integration of design, ...

Understanding your company’s manufacturing process and how to minimize defects has always been important. Today, its importance is increasing with the complexity of products and the customers ...